PUBLICATIONS

1.R.Gunnella , M.Benfatto, C.R.Natoli,and A.Marcelli,“Application of a complex potential to the interpretation of XANES spectra.The case of Na K-edge in NaCl ”,Solid State Comm.76 ,109 (1990).(Oxford)

2.S.Gota, R.Gunnella, ZiYuWu, G.Jezequel, C.R.Natoli, D.Sebilleau, E.L.Bullock, F.Proix, C.Guillot, and A.Quemerais,”Chemical-shift low-energy photoelectron diffraction: a determination of the InP(110) clean surface structural relaxation ”, Phys.Rev.Lett.71 ,3387 (1993).(Woodbury)

3.I.Davoli, R.Bernardini, C.Battistoni, P.Castrucci, R.Gunnella , and M.DeCrescenzi, ”Angular Dependence of the EX.F.A.S (EXtended Fine Auger Structure) in MgO(100) surface: short range order vs.diffraction effects)”, Surf.Sci.306 ,144 (1994).(Amsterdam)

4.E.L.Bullock, R.Gunnella, L.Patthey, T.Abukawa, S.Kono, C.R.Natoli, and L.S.Johansson,”Surface Core Level Photoelectron Diffraction from the Si dimers at the Si(001)-2x1 Surface ”, Phys.Rev.Lett.74 , 2756 (1995).(Woodbury)

5. M.De Crescenzi, R.Gunnella , R.Bernardini, M.De Marco,and I.Davoli,”Auger Electron Diffraction in the low kinetic range:study of Si(111)7x7 surface reconstruction and Ge/Si interface formation ”, Phys.Rev.B 52 , 1806 (1995).(Woodbury)

6.R.Gunnella, I.Davoli, R.Bernardini, and M.De Crescenzi, ”Inelastic processes vs. diffraction effects: polar angle energy loss spectra of the graphite K-edge ”,Phys.Rev.B.52 ,17091 (1995).(Woodbury).

7.M.De Crescenzi, R.Gunnella , and I.Davoli,”Structural surface investigation with low energy backscattered electrons ”, Journal of El.Spectr.and Rel.Phen.76 ,29 (1995).(Amsterdam)

8.I.Davoli, R.Gunnella, P.Castrucci, R.Bernardini, and M.De Crescenzi,”Incident beam effects in AED (Auger Electron Diffraction): the case of Cu(001)”, Journal of El.Spectr.and Rel.Phen.76 ,493 (1995).(Amsterdam)

9.R.Gunnella, P.Castrucci, N.Pinto, I.Davoli, D.Sebilleau, and M.De Crescenzi,”XPD study of intermixing and morphology at the Ge/Si(001)and Ge/Sb/Si(001)interface ”, Phys.Rev.B 54 ,8882 (1996).(Woodbury)

10.R.Gunnella, E.L.Bullock, C.R.Natoli, R.I.G.Uhrberg, and L.S.O.Johansson,”The As/Si(111) surface studied by Angle Scanned Low Energy Photoelectron Diffraction ”,Surf.Sci.,352-354 ,332 (1996).(Amsterdam)

11.E.L.Bullock, R.Gunnella, C.R Natoli, H.W.Yeom, S.Kono, L.Patthey, R.I.G.Uhrberg, and L.S.O. Johansson,”Angle dependence of the Spin-Orbit Branching Ratio ”, Surf.Sci.352-354 ,352 (1996).(Amsterdam)

12.L.S.O.Johansson, R.Gunnella, E.L.Bullock, C.R.Natoli, and R.I.G.Uhrberg,”Surface Core Level Shift Photoelectron Diffraction from As/Si(111),Appl.Surf.Sci.104/105 ,88 (1996).(Amsterdam)

13.I.Davoli, R.Gunnella, P.Castrucci, N.Pinto, R.Bernardini, and M.De Crescenzi,”XPD study of atomic intermixing at the Ge/Si(100)interface ”, Appl.Surf.Sci.102 ,102 (1996).(Amsterdam)

14.M.De Crescenzi, S.Colonna, R.Gunnella, and M.Fanfoni, ”Extended Fine Structure in the secondary backscattered electrons ”, Progress in Surface Science 53, No.2-4,pp.253-264 (1996).(Oxford)

15.G.Dufour, F.Rochet, F.C.Stedile ,Ch.Poncey, M.De Crescenzi, R.Gunnella, and M.Froment, ”SiC formation by reaction of Si(001)with acetylene:Electronic strucure and growth mode ”, Phys.Rev.B 56 ,4266 (1997) (Woodbury)

16.I.Davoli, R.Gunnella, R.Bernardini, and M.De Crescenzi,”Low Kinetic energy AED: a tool for the study of Ge epitaxial layers grown on Sb-terminated Si(111)surface ”, Journal of Electr.Spectr.and Rel.Phen.83 ,137 (1997).(Amsterdam)

17.R.Gunnella, P.Castrucci, N.Pinto, P.Cucculelli, I.Davoli, D.Sebilleau, and M.De Crescenzi, ”Surfactant Mediated growth of Ge/Si(001)interface studied by XPD ”,Surface Review and Letters 5 ,157 (1998).(Singapore)

18.R.Gunnella, J.Y.Veuillen, A.Berthet, and T.A.Nguyen Tan,”Electronic and structural properties of the 6H-SiC(0001) surfaces ”, Surface Review and Letters 5 ,187 (1998).(Singapore).

19.R.Gunnella, J.Y.Veuillen, T.A.Nguyen Tan and A.M.Flank, ”X-ray absorption spectroscopy study of atomic structure of epitaxial ErSi 1 .7 (0001) on Si(111)”, Phys.Rev.B 57 ,4154 (1998). (Woodbury)

20.C.Rojas, C.Polop, E.Roman, J.A.Martin Gago, R.Gunnella, B.Brena, D.Cocco, G.Paolucci, ”Origin of buckling in the c(2x2)-Si/Cu(110) surface alloy ”, Phys.Rev.B 57 , 4493 (1998). (Woodbury)

21.R.Gunnella, E.L.Bullock, L.Patthey, T.Abukawa, S.Kono, and L.S.Johansson, ”Surface Core Level Photoelectron Diffraction as a highly sensitive tool for structural study of reconstructed clean surfaces: the case of 2x1-Si(001)surface”, Phys.Rev.B 57 ,14739 (1998).(Woodbury)

22.P.Castrucci, R.Gunnella, M.De Crescenzi, M.Sacchi, G.Dufour, F.Rochet, ”X-ray absorption at Ge L3-edge as a tool to investigate Ge/Si(001) interfaces and heterostructures ”,J.Vac.Sci.Technol.B 16(3),1616 (1998). (New York)

23.I.Davoli, R.Gunnella, R.Bernardini, and M.De Crescenzi, ”Evidences for suppression of incident beam effects in Auger electron diffracton ”,Surf.Sci.396 ,221 (1998). (Amsterdam)

24.P.Castrucci, R.Gunnella, M.De Crescenzi, M.Sacchi, G.Dufour, F.Rochet, ”Exchange mechanism at the Ge/Si(001)interface from a multiple scattering analysis of the Ge L 3 -edge, Phys.Rev.B 58 ,4095 (1998). (Woodbury)

25.P.Castrucci, R.Gunnella, N.Pinto, M.De Crescenzi, M.Sacchi, G.Dufour, F.Rochet, ”Evidences of ordered phase of Ge-Si heterostructures by x-ray absorption spectroscopy at the Ge L 3 edge,Surf.Sci.416 ,466 (1998). (Amsterdam)

26.M.De Crescenzi, R.Gunnella , P.Castrucci, and I.Davoli, ”Local structure investigation of silicon surfaces by electron scattering ”, Il Nuovo Cimento 20 ,991(1998).

(Bologna)

27.F.C.Stedile, F.Rochet, C.Poncey, G.Dufour, R.Gunnella ,and M.De Crescenzi, M.Froment, ”First stages of low temperature and low pressure carbonization of Si(001) in acetylene ”, Nucl.Instrum.and Methods.B138 , 301 (1998). (Amsterdam)

28.J.Y.Veuillen, T.A.Nguyen Tan, I.Tsiaoussis, N.Frangis, M.Brunel and R.Gunnella ,”Reaction of Palladium thin films with a Si-rich 6H-SiC(0001)(3x3)surface ”, Diamond and Related Materials 8,352 (1999). (Amsterdam)

29.M.De Crescenzi, M.Marucci, R.Gunnella , P.Castrucci, M.Casalboni, G.Dufour, F.Rochet, ”Si 1 •x C x formation by reaction of Si(111)with acetylene:growth mode, electronic structure and luminescence investigation ”, Surf.Sci.426 , 277 (1999). (Amsterdam)

30.P.Castrucci, R.Gunnella, M.De Crescenzi, M.Sacchi, G.Dufour, and F.Rochet, ”Electronic density of empty states of Ge/Si(111)epitaxial layers:theory and experiment ”, Phys.Rev.B 60 ,5759 (1999). (Woodbury)

31.G.Gubbiotti, L.Albini, S.Tacchi, G.Carlotti, R.Gunnella and M.De Crescenzi, ”Structural and magnetic properties of epitaxial Cu/Fe/Cu/Si(111) ultrathin films ”, Phys.Rev.B 60 ,17150 (1999).(Woodbury)

32.G.Gubbiotti, G.Carlotti, S.Loreti, C.Minarini, R.Gunnella , and M.De Crescenzi, ”Metal-Metal Epitaxy on Silicon: Cu/Ni/Cu ultrathin films on 7x7-Si(111)”, Surf.Sci.449,218 (2000). (Amsterdam)

33.M.Rocca, L.Savio, L.Vattuone, U.Burghaus, V.Palomba, N.Novelli,F.Buatier de Mongeot, U.Valbusa, R.Gunnella, G.Comelli, A.Baraldi, S.Lizzit, and G.Paolucci, ”Phase transition of dissociatively adsorbed oxygen on Ag(001)”, Phys.Rev.B 61 213 (2000). (Woodbury)

34.M.De Crescenzi, R.Bernardini, R.Gunnella, P.Castrucci, M.Casalboni, R.Pizzoferrato, G.Dufour, and F. Rochet, “Interaction of acetylene on Si(111): growth and luminescence study of Si_1-xC_x thin layer”, Philosophical Magazine B 80,669 (2000). (Los Alamos)

35. P.Castrucci, R.Gunnella, N.Pinto, R.Bernardini, M.De Crescenzi, M.Sacchi, “Near-edge x-ray absorption and photoelectron diffraction of Ge/Si heterostructures” , Surface Review and Letters 7, 322 (2000). (Singapore)

36.G. Gubbiotti, G. Carlotti, F. D’Orazio, F. Lucari, R.Gunnella, M.De Crescenzi ,” Perpendicualar magnetization in epitaxial Cu/Fe/Cu/Si(111) ultrathin films ”, Surf. Sci. 454-456, 891 (2000). (Amsterdam)

37.R.Gunnella, F.Solal, D.Sebilleau, and C.R.Natoli, ”MSPHD:A full multiple scattering code for low energy photoelectron diffraction ”, Comput.Phys.Comm . 132, No. 3.,pp. 251-266, (2000). (Amsterdam)

38.P.Castrucci, R.Gunnella, R.Bernardini, M.De Crescenzi, C.Crotti, C.Ottaviani, G.Gubbiotti, G.Carlotti, ”Electronic states and magnetism of ultrathin Fe/Cu/Si(111) films" , Surf. Sci 476, 43 (2001). (Amsterdam)

39.M.Sacchi, P.Castrucci, R.Gunnella, M.De Crescenzi ,”Resonant Magnetic Scattering from fcc Cu/Fe/Cu trilayers ”, Phys. Rev. B64, 12403 (2001) (Woodbury)

40.P. De Padova, R. Larciprete, C. Quaresima, R. Gunnella, A. Reginelli, L. Ferrari, P. Perfetti, K. Yu-Zhang, Y. Leprince-Wang, High resolution photoemission core level spectroscopy study and TEM analysis of the Ge/As/Si(001) “, Surf. Sci. 482-485, 574 (2001).(Amsterdam)

41. L. Ferrari, M. Pedio, N. Barrett, R. Gunnella, M. Capozi, C. Ottaviani, P. Perfetti, Photoelectron Diffraction study on Ge(100) 3d core level”, Surf. Sci. 482-485, 1287 (2001). (Amsterdam)

42. P. Castrucci, R. Gunnella, R. Bernardini, A. Montecchiari, R. Carboni, and M. De Crescenzi, “Epitaxy of Fe/Cu/Si(111) ultrathin films: an Auger electron diffraction study”, Surf. Sci. 482-485, 916 (2001) (Amsterdam)

43. M. De Crescenzi, R. Bernardini, S. Pollano, R. Gunnella, P. Castrucci, G. Dufour, F. Rochet, “Acetylene on Si(111): carbon incorporation in the growth of c-SiC thin layers”, Surf. Sci. 489 (2001) 185. (Amsterdam)

44. R. Gunnella, H.W. Yeom, E.L. Bullock, L.S.O. Johansson, S. Kono, and F. Solal, " Study of Si 2p core level shift in As/Si(001)-2x1 surface”, Surf. Sci. 499, 244 (2002). (Amsterdam)

45. P. Castrucci, R. Gunnella, R. Bernardini, P. Falcioni, and M. De Crescenzi, “ Magnetic Force Microscopy study of perpendicular magnetization reorientation for Fe grown on Cu/Si(111)”, Phys. Rev. B 65, 235435 (2002). (Woodbury)

46. P. Castrucci, R. Gunnella, N. Pinto, and M. De Crescenzi, “ Structural and photoluminescence properties of Ge-Si ultra-thin films and heterostructure”, J. Phys.:Condens. Matter 14 ,8333 (2002). (London)

47. M. De Crescenzi, R. Bernardini, R. Gunnella, P. Castrucci, “ Structure and morphology of c-SiC films obtained by acetilene reaction with Si(111) surface”, Solid State Communic. 123, 27 (2002).

48. d'Acapito F, Castrucci P, Pinto N, Gunnella R, De Crescenzi M, Davoli I , “The effect of Sb surfactant on the growth of (GenSim)(p) layers on Si(001): a reflEXAFS study”, Surf. Sci. 518, 183 (2002) (Amsterdam)

49. M. De Crescenzi, R. Bernardini, M. Cardella, R. Gunnella, P. Castrucci, R. Pizzoferrato, M. Casalboni, “Structural and electronic investigation of Si(001) surface after acetylene interaction”, Surf. Sci. 521, 57 (2002). (Amsterdam)

50. D'Orazio F, Lucari F, Santucci S, Picozzi P, Verna A, Passacantando M, Pinto N, Morresi L, GunnellaR, MurriR “Magneto-optical properties of epitaxial MnxGe1-x films”, J. Magn. Magn. Mater. 262 (1): 158-161 ( 2003) (Amsterdam)

51. Pinto N, Morresi L, Gunnella R, Murri R, D'Orazio F, Lucari F, Santucci S, Picozzi P, Passacantando M, Verna A , “Growth and magnetic properties of MnGe films for spintronic application”, J. Mater. Sci.-Mater. Electr. 14 (5-7): 337-340 (2003) (Norwell)

52. Finetti P, Borgatti F, Felici R, Gunnella R, D'Addato S , “Structure properties of nanostructured Fe films grown on c(2 x 2) N/Cu(100) self-organised surface”,
Appl. Surf. Sci. 212: 85-91 (2003). (Amsterdam)

53. R. Gunnella , M. Shimomura , M. Munakata, T. Takano,T. Yamazaki, T. Abukawa, S. Kono, “Structural study of 1,4-cyclohexadiene adsorption on Si(001) surface by low energy photoelectron diffraction”, Surf. Sci. 566–568 (2004) 618–623 (Amsterdam)

54. P. Castrucci , R. Gunnella , P. Candeloro , E. Di Fabrizio, M. Conti , G. Carlotti , G. Gubbiotti, F. Montoncello, R. Zivieri, M. Scarselli, M. De Crescenzi, “Magnetic properties of rectangular permalloy prisms: a combined magnetic force microscopy and magneto-optic Kerr study”, Surf. Sci. 566–568 (2004) 291–296 (Amsterdam)

55. A. Shimomura, Y. Ikejima, K. Yajima, T. Yagi, T. Goto, R. Gunnella, T. Abukawa, Y. Fukuda, S. Kono, “Adsorption of thiophene on a Si(001)-2 x 1 surface studied by photoelectron spectroscopy and diffraction”, Appl. Surf. Sci. 237, 75-79(2004).

56. Gunnella R, Morresi L, Pinto N, Murri R, Ottaviano L, Passacantando M, D'Orazio F, Lucari F, “Magnetization of epitaxial MnGe alloys on Ge(111) substrates”, Surf. Sci. 577 , 22-30 (2005) (Amsterdam).

“

57. A. Di Cicco, B. Giovenali, R. Gunnella, E. Principi, S. Simonucci

“Metallization of the Ge(111) surface at high-temperature probed by

energy-loss and Auger spectroscopies”, Solid State Communications 134 (2005) 577–582

58) D. Sebilleau, R. Gunnella, S. Di Matteo, Z.-Y. Wu, C. R. Natoli, “Multiple-scattering approach with complex potential in the interpretation of electron and photon spectroscopies” J. Phys.: Condens. Matter 18, R175-R230 (2006)

59) Ottaviano L, Passacantando M, Picozzi S, Continenza A, Gunnella R, Verna A, Bihlmayer G, Impellizzeri G, Priolo F “Phase separation and dilution in implanted MnxGe1-x alloys” Appl. Phys. Lett. 88, 061907 (2006) (selected for publication on the Virtual Journal of Nanascience and technology).

60)R. Gunnella, M. Shimomura, F. D’Amico, T. Abukawa, and S. Kono, Photoelectron diffraction of C6H8/Si(100) A model case for photoemission study of organic molecules adsorbed on silicon surfaces, Phys. Rev. B 73, 235435 (2006) ) (selected for publication on the Virtual Journal of Nanascience and technology).